There is potential for memory corruption in the RIL daemon...
Vulnerability Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Impact Analysis
Refer to official advisory for detailed impact metrics.
Remediation
Ensure systems are updated to the latest vendor-supplied patch levels.
Am I Vulnerable?
Launch our assessment wizard to check if your infrastructure is exposed to • CVE-2018-13888
Credits & Attribution
No credits recorded in the NVD database.
References
More from Qualcomm, Inc.
View All →Affected Vendor
Qualcomm, Inc.
View all reports →Affected Software
Timeline
CVSS Vectors
Weaknesses (CWE)
No CWE data available
MITRE ATT&CK TTPs
No associated TTPs found for this vulnerability.