Lack of check of input size can make device memory...
Vulnerability Description
Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130
Impact Analysis
Refer to official advisory for detailed impact metrics.
Remediation
Ensure systems are updated to the latest vendor-supplied patch levels.
Am I Vulnerable?
Launch our assessment wizard to check if your infrastructure is exposed to • CVE-2018-11279
Credits & Attribution
No credits recorded in the NVD database.
References
More from Qualcomm, Inc.
View All →Affected Vendor
Qualcomm, Inc.
View all reports →Affected Software
Timeline
CVSS Vectors
Weaknesses (CWE)
No CWE data available
MITRE ATT&CK TTPs
No associated TTPs found for this vulnerability.